Chih-Hong Hwang, Yiming Li, Ming-Hung Han. Statistical variability in FinFET devices with intrinsic parameter fluctuations. Microelectronics Reliability, 50(5):635-638, 2010. [doi]
@article{HwangLH10,
title = {Statistical variability in FinFET devices with intrinsic parameter fluctuations},
author = {Chih-Hong Hwang and Yiming Li and Ming-Hung Han},
year = {2010},
doi = {10.1016/j.microrel.2010.01.041},
url = {http://dx.doi.org/10.1016/j.microrel.2010.01.041},
researchr = {https://researchr.org/publication/HwangLH10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {5},
pages = {635-638},
}