Broadband Characterization of Materials Using a Dual-Ridged Waveguide - researchr publication authors

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Milo W. Hyde, Michael J. Havrilla, Andrew E. Bogle, Nathan J. Lehman. Broadband Characterization of Materials Using a Dual-Ridged Waveguide. IEEE T. Instrumentation and Measurement, 62(12):3168-3176, 2013. [doi]

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