Zohair Hyder, John Wawrzynek. Defect Tolerance in Multiple-FPGA Systems. In Tero Rissa, Steven J. E. Wilton, Philip Heng Wai Leong, editors, Proceedings of the 2005 International Conference on Field Programmable Logic and Applications (FPL), Tampere, Finland, August 24-26, 2005. pages 247-254, IEEE, 2005.
@inproceedings{HyderW05,
title = {Defect Tolerance in Multiple-FPGA Systems},
author = {Zohair Hyder and John Wawrzynek},
year = {2005},
researchr = {https://researchr.org/publication/HyderW05},
cites = {0},
citedby = {0},
pages = {247-254},
booktitle = {Proceedings of the 2005 International Conference on Field Programmable Logic and Applications (FPL), Tampere, Finland, August 24-26, 2005},
editor = {Tero Rissa and Steven J. E. Wilton and Philip Heng Wai Leong},
publisher = {IEEE},
isbn = {0-7803-9362-7},
}