Comprehensive Analysis of Distortion in the Passive FET Sample-and-Hold Circuit

Tetsuya Iizuka, Takaaki Ito, Asad A. Abidi. Comprehensive Analysis of Distortion in the Passive FET Sample-and-Hold Circuit. IEEE Trans. on Circuits and Systems, 65-I(4):1157-1173, 2018. [doi]

@article{IizukaIA18,
  title = {Comprehensive Analysis of Distortion in the Passive FET Sample-and-Hold Circuit},
  author = {Tetsuya Iizuka and Takaaki Ito and Asad A. Abidi},
  year = {2018},
  doi = {10.1109/TCSI.2018.2797987},
  url = {https://doi.org/10.1109/TCSI.2018.2797987},
  researchr = {https://researchr.org/publication/IizukaIA18},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on Circuits and Systems},
  volume = {65-I},
  number = {4},
  pages = {1157-1173},
}