Quantifying software test process and product reliability simultaneously - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Shinya Ikemoto, Tadashi Dohi, Hiroyuki Okamura. Quantifying software test process and product reliability simultaneously. In IEEE 24th International Symposium on Software Reliability Engineering, ISSRE 2013, Pasadena, CA, USA, November 4-7, 2013. pages 108-117, IEEE, 2013. [doi]

This author has not been identified. Look up 'Shinya Ikemoto' in GoogleThis author has not been identified. Look up 'Tadashi Dohi' in GoogleThis author has not been identified. Look up 'Hiroyuki Okamura' in Google

runs on WebDSL