Abby A. Ilumoka, Hong Lang Tan. MEMS Failure Probability Prediction and Quality Enhancement Using Neural Networks. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 322-326, IEEE Computer Society, 2007. [doi]
@inproceedings{IlumokaT07,
title = {MEMS Failure Probability Prediction and Quality Enhancement Using Neural Networks},
author = {Abby A. Ilumoka and Hong Lang Tan},
year = {2007},
doi = {10.1109/ISQED.2007.102},
url = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.102},
researchr = {https://researchr.org/publication/IlumokaT07},
cites = {0},
citedby = {0},
pages = {322-326},
booktitle = {8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-2795-6},
}