Kyoung-Sik Im, Jae-Hyok Ko, Suk-Jin Kim, Chan-Hee Jeon, Chang-Su Kim, Ki-Tae Lee, Han-Gu Kim, Il-Hun Son. Novel ESD strategy for high voltage non-volatile programming pin application. Microelectronics Reliability, 46(9-11):1664-1668, 2006. [doi]
@article{ImKKJKLKS06,
title = {Novel ESD strategy for high voltage non-volatile programming pin application},
author = {Kyoung-Sik Im and Jae-Hyok Ko and Suk-Jin Kim and Chan-Hee Jeon and Chang-Su Kim and Ki-Tae Lee and Han-Gu Kim and Il-Hun Son},
year = {2006},
doi = {10.1016/j.microrel.2006.07.051},
url = {http://dx.doi.org/10.1016/j.microrel.2006.07.051},
tags = {programming},
researchr = {https://researchr.org/publication/ImKKJKLKS06},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {46},
number = {9-11},
pages = {1664-1668},
}