João Inácio, Ibéria Medeiros. Effectiveness on C Flaws Checking and Removal. In 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2022, Supplemental Volume, Baltimore, MD, USA, June 27-30, 2022. pages 33-34, IEEE, 2022. [doi]
@inproceedings{InacioM22,
title = {Effectiveness on C Flaws Checking and Removal},
author = {João Inácio and Ibéria Medeiros},
year = {2022},
doi = {10.1109/DSN-S54099.2022.00021},
url = {https://doi.org/10.1109/DSN-S54099.2022.00021},
researchr = {https://researchr.org/publication/InacioM22},
cites = {0},
citedby = {0},
pages = {33-34},
booktitle = {52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2022, Supplemental Volume, Baltimore, MD, USA, June 27-30, 2022},
publisher = {IEEE},
isbn = {978-1-6654-0260-6},
}