Urban Ingelsson, Shih-Yen Chang, Erik Larsson. Measurement point selection for in-operation wear-out monitoring. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 381-386, IEEE, 2011. [doi]
@inproceedings{IngelssonCL11,
title = {Measurement point selection for in-operation wear-out monitoring},
author = {Urban Ingelsson and Shih-Yen Chang and Erik Larsson},
year = {2011},
doi = {10.1109/DDECS.2011.5783115},
url = {http://dx.doi.org/10.1109/DDECS.2011.5783115},
researchr = {https://researchr.org/publication/IngelssonCL11},
cites = {0},
citedby = {0},
pages = {381-386},
booktitle = {14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011},
editor = {Rolf Kraemer and Adam Pawlak and Andreas Steininger and Mario Schölzel and Jaan Raik and Heinrich Theodor Vierhaus},
publisher = {IEEE},
isbn = {978-1-4244-9755-3},
}