Analysis of Artifacts in Subpixel Remote Sensing Image Registration - researchr publication authors

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Jordi Inglada, Vincent Muron, Damien Pichard, Thomas Feuvrier. Analysis of Artifacts in Subpixel Remote Sensing Image Registration. IEEE T. Geoscience and Remote Sensing, 45(1):254-264, 2007. [doi]

This author has not been identified. Look up 'Jordi Inglada' in GoogleThis author has not been identified. Look up 'Vincent Muron' in GoogleThis author has not been identified. Look up 'Damien Pichard' in GoogleThis author has not been identified. Look up 'Thomas Feuvrier' in Google

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