Keisuke Inoue. ECC module optimization for storage transient error-tolerant ASICs. In 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016. pages 269-272, IEEE, 2016. [doi]
@inproceedings{Inoue16-2, title = {ECC module optimization for storage transient error-tolerant ASICs}, author = {Keisuke Inoue}, year = {2016}, doi = {10.1109/ICECS.2016.7841184}, url = {http://dx.doi.org/10.1109/ICECS.2016.7841184}, researchr = {https://researchr.org/publication/Inoue16-2}, cites = {0}, citedby = {0}, pages = {269-272}, booktitle = {2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016}, publisher = {IEEE}, isbn = {978-1-5090-6113-6}, }