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Michiko Inoue, Akira Taketani, Tomokazu Yoneda, Hideo Fujiwara. Test Pattern Ordering and Selection for High Quality Test Set under Constraints. IEICE Transactions, 95-D(12):3001-3009, 2012. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length ConstraintRyoichi Inoue, Toshinori Hosokawa, Hideo Fujiwara. ieicet, 93-D(1):24-32, 2010. [doi]
The following publications are possibly variants of this publication: