Hiroaki Inoue, Junya Yamada, Hideyuki Yoneda, Katsumi Togawa, Koichiro Furuta. Test Compression for Dynamically Reconfigurable Processors. In International Conference on Field Programmable Logic and Applications, FPL 2010, August 31 2010 - September 2, 2010, Milano, Italy. pages 205-210, IEEE, 2010. [doi]
@inproceedings{InoueYYTF10,
title = {Test Compression for Dynamically Reconfigurable Processors},
author = {Hiroaki Inoue and Junya Yamada and Hideyuki Yoneda and Katsumi Togawa and Koichiro Furuta},
year = {2010},
doi = {10.1109/FPL.2010.49},
url = {http://dx.doi.org/10.1109/FPL.2010.49},
tags = {testing},
researchr = {https://researchr.org/publication/InoueYYTF10},
cites = {0},
citedby = {0},
pages = {205-210},
booktitle = {International Conference on Field Programmable Logic and Applications, FPL 2010, August 31 2010 - September 2, 2010, Milano, Italy},
publisher = {IEEE},
}