Algorithm for Detecting Implicitly Faulty Replicas Based on the Power Consumption Model

Hazuki Ishii, Ryuji Oma, Shigenari Nakamura, Tomoya Enokido, Makoto Takizawa 0001. Algorithm for Detecting Implicitly Faulty Replicas Based on the Power Consumption Model. In Leonard Barolli, Peter Hellinckx, Tomoya Enokido, editors, Advances on Broad-Band Wireless Computing, Communication and Applications - Proceedings of the 14th International Conference on Broad-Band Wireless Computing, Communication and Applications, BWCCA 2019, Antwerp, Belgium, November 7-9, 2019. Volume 97 of Lecture Notes in Networks and Systems, pages 483-493, Springer, 2019. [doi]

Authors

Hazuki Ishii

This author has not been identified. Look up 'Hazuki Ishii' in Google

Ryuji Oma

This author has not been identified. Look up 'Ryuji Oma' in Google

Shigenari Nakamura

This author has not been identified. Look up 'Shigenari Nakamura' in Google

Tomoya Enokido

This author has not been identified. Look up 'Tomoya Enokido' in Google

Makoto Takizawa 0001

This author has not been identified. Look up 'Makoto Takizawa 0001' in Google