Eliminating of the Drawback of Existing Testing Technique of Easily Testable PLAs Using an Improved Testing Algorithm with Product Line Rearrangement

Md. Rafiqul Islam, Morshed U. Chowdhury. Eliminating of the Drawback of Existing Testing Technique of Easily Testable PLAs Using an Improved Testing Algorithm with Product Line Rearrangement. In S. R. Subramanya, editor, Proceedings of the 15th International Conference on Computer Applications in Industry and Engineering, November 7-9, 2002, Clarion Hotel Bay View, San Diego, California, USA. pages 239-242, ISCA, 2002.

Authors

Md. Rafiqul Islam

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Morshed U. Chowdhury

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