Mofakharul Islam, John Yearwood, Peter Vamplew. Unsupervised Segmentation of Industrial Images Using Markov Random Field Model. In Magued Iskander, Vikram Kapila, Mohammad A. Karim, editors, Technological Developments in Education and Automation, proceedings of the 2008 International Conference on Engineering Education, Instructional Technology, Assessment, and E-learning (EIAE 08) and International Conference on Industrial Electronics, Techn. pages 369-374, Springer, 2008. [doi]
@inproceedings{IslamYV08,
title = {Unsupervised Segmentation of Industrial Images Using Markov Random Field Model},
author = {Mofakharul Islam and John Yearwood and Peter Vamplew},
year = {2008},
doi = {10.1007/978-90-481-3656-8_67},
url = {http://dx.doi.org/10.1007/978-90-481-3656-8_67},
researchr = {https://researchr.org/publication/IslamYV08},
cites = {0},
citedby = {0},
pages = {369-374},
booktitle = {Technological Developments in Education and Automation, proceedings of the 2008 International Conference on Engineering Education, Instructional Technology, Assessment, and E-learning (EIAE 08) and International Conference on Industrial Electronics, Techn},
editor = {Magued Iskander and Vikram Kapila and Mohammad A. Karim},
publisher = {Springer},
isbn = {978-90-481-3655-1},
}