Gaussian Process Regression Remaining Useful Lifetime Prediction of Thermally Aged Power IGBT

Adla Ismail, Lotfi Saidi, Mounir Sayadi, Mohamed Benbouzid. Gaussian Process Regression Remaining Useful Lifetime Prediction of Thermally Aged Power IGBT. In IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, Lisbon, Portugal, October 14-17, 2019. pages 6004-6009, IEEE, 2019. [doi]

Authors

Adla Ismail

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Lotfi Saidi

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Mounir Sayadi

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Mohamed Benbouzid

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