Adla Ismail, Lotfi Saidi, Mounir Sayadi, Mohamed Benbouzid. Gaussian Process Regression Remaining Useful Lifetime Prediction of Thermally Aged Power IGBT. In IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, Lisbon, Portugal, October 14-17, 2019. pages 6004-6009, IEEE, 2019. [doi]