Guest Editorial Complex Network for Modern Smart Grid Application - Part 2: Stability, Reliability and Resilience Issues

Herbert Ho-Ching Iu, Chia-Chi Chu, Chika O. Nwankpa, Chai Wah Wu. Guest Editorial Complex Network for Modern Smart Grid Application - Part 2: Stability, Reliability and Resilience Issues. IEEE J. Emerg. Sel. Topics Circuits Syst., 7(3):345-348, 2017. [doi]

@article{IuCNW17a,
  title = {Guest Editorial Complex Network for Modern Smart Grid Application - Part 2: Stability, Reliability and Resilience Issues},
  author = {Herbert Ho-Ching Iu and Chia-Chi Chu and Chika O. Nwankpa and Chai Wah Wu},
  year = {2017},
  doi = {10.1109/JETCAS.2017.2723698},
  url = {https://doi.org/10.1109/JETCAS.2017.2723698},
  researchr = {https://researchr.org/publication/IuCNW17a},
  cites = {0},
  citedby = {0},
  journal = {IEEE J. Emerg. Sel. Topics Circuits Syst.},
  volume = {7},
  number = {3},
  pages = {345-348},
}