Eero Ivask, Jaan Raik, Raimund Ubar, André Schneider. Web-Based Environment for Digital Electronics Test Tools. In Luis M. Camarinha-Matos, editor, Virtual Enterprises and Collaborative Networks, IFIP 18th World Computer Congress, TC5 / WG5.5 - 5th Working Conference on Virtual Enterprises, 22-27 August 2004, Toulouse, France. pages 435-442, Kluwer, 2004.
@inproceedings{IvaskRUS04,
title = {Web-Based Environment for Digital Electronics Test Tools},
author = {Eero Ivask and Jaan Raik and Raimund Ubar and André Schneider},
year = {2004},
tags = {rule-based, meta-model, testing, Meta-Environment, meta-objects},
researchr = {https://researchr.org/publication/IvaskRUS04},
cites = {0},
citedby = {0},
pages = {435-442},
booktitle = {Virtual Enterprises and Collaborative Networks, IFIP 18th World Computer Congress, TC5 / WG5.5 - 5th Working Conference on Virtual Enterprises, 22-27 August 2004, Toulouse, France},
editor = {Luis M. Camarinha-Matos},
publisher = {Kluwer},
isbn = {1-4020-8138-3},
}