Tsuyoshi Iwagaki, Eiri Takeda, Mineo Kaneko. Flexible Test Scheduling for an Asynchronous On-Chip Interconnect through Special Data Transfer. IEICE Transactions, 94-A(12):2563-2570, 2011. [doi]
@article{IwagakiTK11,
title = {Flexible Test Scheduling for an Asynchronous On-Chip Interconnect through Special Data Transfer},
author = {Tsuyoshi Iwagaki and Eiri Takeda and Mineo Kaneko},
year = {2011},
url = {http://search.ieice.org/bin/summary.php?id=e94-a_12_2563},
researchr = {https://researchr.org/publication/IwagakiTK11},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {94-A},
number = {12},
pages = {2563-2570},
}