Tomomu Iwai, Yuta Ohno, Akira Niwa, Yuichi Nakamura, Keiya Sakai, Kanae Matsui, Hiroaki Nishi. Self-Organizing Map Using Classification Method for Services in Multilayer Computing Environments. In IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, Washington, DC, USA, October 21-23, 2018. pages 4193-4198, IEEE, 2018. [doi]
@inproceedings{IwaiONNSMN18,
title = {Self-Organizing Map Using Classification Method for Services in Multilayer Computing Environments},
author = {Tomomu Iwai and Yuta Ohno and Akira Niwa and Yuichi Nakamura and Keiya Sakai and Kanae Matsui and Hiroaki Nishi},
year = {2018},
doi = {10.1109/IECON.2018.8591565},
url = {https://doi.org/10.1109/IECON.2018.8591565},
researchr = {https://researchr.org/publication/IwaiONNSMN18},
cites = {0},
citedby = {0},
pages = {4193-4198},
booktitle = {IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, Washington, DC, USA, October 21-23, 2018},
publisher = {IEEE},
isbn = {978-1-5090-6684-1},
}