Effects of Virtual Development on Product Quality: Exploring Defect Causes

Jef Jacobs, J. H. van Moll, Paul J. Krause, Rob J. Kusters, Jos J. M. Trienekens. Effects of Virtual Development on Product Quality: Exploring Defect Causes. In 11th International Workshop on Software Technology and Engineering Practice (STEP 2003), 19-21 September 2003, Amsterdam, The Netherlands. pages 6-15, IEEE Computer Society, 2003. [doi]

Authors

Jef Jacobs

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J. H. van Moll

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Paul J. Krause

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Rob J. Kusters

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Jos J. M. Trienekens

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