Accurate Estimation of Signal Currents for Reliability Analysis Considering Advanced Waveform-Shape Effects - researchr publication authors

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Palkesh Jain, Ankit Jain. Accurate Estimation of Signal Currents for Reliability Analysis Considering Advanced Waveform-Shape Effects. In VLSI Design 2011: 24th International Conference on VLSI Design, IIT Madras, Chennai, India, 2-7 January 2011. pages 118-123, IEEE, 2011. [doi]

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