Reliability Analysis for Embedded System with Two Types of Faults and Common Cause Failure Using Markov process - researchr publication authors

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Madhu Jain, Manju Kaushik, Gireesh Kumar. Reliability Analysis for Embedded System with Two Types of Faults and Common Cause Failure Using Markov process. In Proceedings of the Sixth International Conference on Computer and Communication Technology 2015, ICCCT 2015, Allahabad, India, September 25-27, 2015. pages 271-275, ACM, 2015. [doi]

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