Won-Dong Jang, Chang-Su Kim. SEQM: Edge quality assessment based on structural pixel matching. In 2012 Visual Communications and Image Processing, VCIP 2012, San Diego, CA, USA, November 27-30, 2012. pages 1-6, IEEE, 2012. [doi]
@inproceedings{JangK12,
title = {SEQM: Edge quality assessment based on structural pixel matching},
author = {Won-Dong Jang and Chang-Su Kim},
year = {2012},
doi = {10.1109/VCIP.2012.6410731},
url = {http://dx.doi.org/10.1109/VCIP.2012.6410731},
researchr = {https://researchr.org/publication/JangK12},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {2012 Visual Communications and Image Processing, VCIP 2012, San Diego, CA, USA, November 27-30, 2012},
publisher = {IEEE},
isbn = {978-1-4673-4405-0},
}