Jiyong Jang, Sungroh Yoon. Feature Concentration for Supervised and Semisupervised Learning With Unbalanced Datasets in Visual Inspection. IEEE Transactions on Industrial Electronics, 68(8):7620-7630, 2021. [doi]
@article{JangY21,
title = {Feature Concentration for Supervised and Semisupervised Learning With Unbalanced Datasets in Visual Inspection},
author = {Jiyong Jang and Sungroh Yoon},
year = {2021},
doi = {10.1109/TIE.2020.3003622},
url = {https://doi.org/10.1109/TIE.2020.3003622},
researchr = {https://researchr.org/publication/JangY21},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Industrial Electronics},
volume = {68},
number = {8},
pages = {7620-7630},
}