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Observation of Readout Temperature Dependence and Its Variability for the MEMS and ASIC System Specimens and Their PCB Testbenches

Mariusz Jankowski, Jacek Nazdrowicz, Piotr Zajac, Piotr Amrozik, Michal Szermer, Cezary Maj, Grzegorz Jablonski. Observation of Readout Temperature Dependence and Its Variability for the MEMS and ASIC System Specimens and Their PCB Testbenches. In 29th International Conference on Mixed Design of Integrated Circuits and System, MIXDES 2022, Wrocław, Poland, June 23-24, 2022. pages 110-115, IEEE, 2022. [doi]

Authors

Mariusz Jankowski

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Jacek Nazdrowicz

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Piotr Zajac

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Piotr Amrozik

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Michal Szermer

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Cezary Maj

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Grzegorz Jablonski

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