The Influence of Global Parametric Faults on Analogue Electronic Circuits Time Domain Response Features - researchr publication authors

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Piotr Jantos, Damian Grzechca, Tomasz Golonek, Jerzy Rutkowski. The Influence of Global Parametric Faults on Analogue Electronic Circuits Time Domain Response Features. In Bernd Straube, Milos Drutarovský, Michel Renovell, Peter Gramata, Mária Fischerová, editors, Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), Bratislava, Slovakia, April 16-18, 2008. pages 299-303, IEEE Computer Society, 2008. [doi]

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