M. Reza Javaheri, Reza Sedaghat. Strength violation effect on soft-error detection in sub-micron technology. Microelectronics Reliability, 50(7):971-977, 2010. [doi]
@article{JavaheriS10,
title = {Strength violation effect on soft-error detection in sub-micron technology},
author = {M. Reza Javaheri and Reza Sedaghat},
year = {2010},
doi = {10.1016/j.microrel.2010.03.002},
url = {http://dx.doi.org/10.1016/j.microrel.2010.03.002},
researchr = {https://researchr.org/publication/JavaheriS10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {7},
pages = {971-977},
}