Systematic Software Testing of Critical Embedded Digital Devices in Nuclear Power Applications - researchr publication authors

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Athira Varma Jayakumar, Smitha Gautham, D. Richard Kuhn, Brandon J. Simon, Aidan G. Collins, Thomas Dirsch, Raghu Kacker, Carl R. Elks. Systematic Software Testing of Critical Embedded Digital Devices in Nuclear Power Applications. In 2020 IEEE International Symposium on Software Reliability Engineering Workshops, ISSRE Workshops, Coimbra, Portugal, October 12-15, 2020. pages 85-90, IEEE, 2020. [doi]

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