Sandeep Jeereddy, Ken Kennedy, Eddie Duffy, Annie Walker, Bennie Vorster. Machine Learning Use Cases for Smart Manufacturing KPIs. In 2019 IEEE International Conference on Big Data (Big Data), Los Angeles, CA, USA, December 9-12, 2019. pages 4375-4380, IEEE, 2019. [doi]
@inproceedings{JeereddyKDWV19,
title = {Machine Learning Use Cases for Smart Manufacturing KPIs},
author = {Sandeep Jeereddy and Ken Kennedy and Eddie Duffy and Annie Walker and Bennie Vorster},
year = {2019},
doi = {10.1109/BigData47090.2019.9006539},
url = {https://doi.org/10.1109/BigData47090.2019.9006539},
researchr = {https://researchr.org/publication/JeereddyKDWV19},
cites = {0},
citedby = {0},
pages = {4375-4380},
booktitle = {2019 IEEE International Conference on Big Data (Big Data), Los Angeles, CA, USA, December 9-12, 2019},
publisher = {IEEE},
isbn = {978-1-7281-0858-2},
}