Min-Chie Jeng, Cheng Hsiao, Ke-Wei Su, Chung-Kai Lin. Circuit reliability simulation using TMI2. In Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, San Jose, CA, USA, September 22-25, 2013. pages 1-7, IEEE, 2013. [doi]
@inproceedings{JengHSL13,
title = {Circuit reliability simulation using TMI2},
author = {Min-Chie Jeng and Cheng Hsiao and Ke-Wei Su and Chung-Kai Lin},
year = {2013},
doi = {10.1109/CICC.2013.6658491},
url = {http://dx.doi.org/10.1109/CICC.2013.6658491},
researchr = {https://researchr.org/publication/JengHSL13},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, San Jose, CA, USA, September 22-25, 2013},
publisher = {IEEE},
}