Simon Jenni, Paolo Favaro. Self-Supervised Feature Learning by Learning to Spot Artifacts. In 2018 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2018, Salt Lake City, UT, USA, June 18-22, 2018. pages 2733-2742, IEEE Computer Society, 2018. [doi]
@inproceedings{JenniF18-0,
title = {Self-Supervised Feature Learning by Learning to Spot Artifacts},
author = {Simon Jenni and Paolo Favaro},
year = {2018},
url = {http://openaccess.thecvf.com/content_cvpr_2018/html/Jenni_Self-Supervised_Feature_Learning_CVPR_2018_paper.html},
researchr = {https://researchr.org/publication/JenniF18-0},
cites = {0},
citedby = {0},
pages = {2733-2742},
booktitle = {2018 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2018, Salt Lake City, UT, USA, June 18-22, 2018},
publisher = {IEEE Computer Society},
}