Juyoung Jeon, Shin Hong. Improving Mutation-Based Fault Localization with Plausible-code Generating Mutation Operators. In 36th IEEE/ACM International Conference on Automated Software Engineering, ASE 2021, Melbourne, Australia, November 15-19, 2021. pages 1205-1207, IEEE, 2021. [doi]
@inproceedings{JeonH21-0,
title = {Improving Mutation-Based Fault Localization with Plausible-code Generating Mutation Operators},
author = {Juyoung Jeon and Shin Hong},
year = {2021},
doi = {10.1109/ASE51524.2021.9678577},
url = {https://doi.org/10.1109/ASE51524.2021.9678577},
researchr = {https://researchr.org/publication/JeonH21-0},
cites = {0},
citedby = {0},
pages = {1205-1207},
booktitle = {36th IEEE/ACM International Conference on Automated Software Engineering, ASE 2021, Melbourne, Australia, November 15-19, 2021},
publisher = {IEEE},
isbn = {978-1-6654-0337-5},
}