Susmit Jha, Wenchao Li, Sanjit A. Seshia. Localizing transient faults using dynamic bayesian networks. In IEEE International High Level Design Validation and Test Workshop, HLDVT 2009, San Francisco, CA, USA, 4-6 November 2009. pages 82-87, IEEE, 2009. [doi]
@inproceedings{JhaLS09-0,
title = {Localizing transient faults using dynamic bayesian networks},
author = {Susmit Jha and Wenchao Li and Sanjit A. Seshia},
year = {2009},
doi = {10.1109/HLDVT.2009.5340170},
url = {http://dx.doi.org/10.1109/HLDVT.2009.5340170},
researchr = {https://researchr.org/publication/JhaLS09-0},
cites = {0},
citedby = {0},
pages = {82-87},
booktitle = {IEEE International High Level Design Validation and Test Workshop, HLDVT 2009, San Francisco, CA, USA, 4-6 November 2009},
publisher = {IEEE},
}