Gan Jian-Hong, Peng Qiang, Jim X. Chen. Improved Strategies for OBB Fitting and Overlap Test for OBB. In International Conference on Computer Science and Software Engineering, CSSE 2008, Volume 2: Software Engineering, December 12-14, 2008, Wuhan, China. pages 996-999, IEEE Computer Society, 2008. [doi]
@inproceedings{Jian-HongQC08,
title = {Improved Strategies for OBB Fitting and Overlap Test for OBB},
author = {Gan Jian-Hong and Peng Qiang and Jim X. Chen},
year = {2008},
doi = {10.1109/CSSE.2008.969},
url = {http://dx.doi.org/10.1109/CSSE.2008.969},
tags = {testing},
researchr = {https://researchr.org/publication/Jian-HongQC08},
cites = {0},
citedby = {0},
pages = {996-999},
booktitle = {International Conference on Computer Science and Software Engineering, CSSE 2008, Volume 2: Software Engineering, December 12-14, 2008, Wuhan, China},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3336-0},
}