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Multi-resolution edge detection with edge pattern analysis

Bo Jiang. Multi-resolution edge detection with edge pattern analysis. In Dietmar Wüller, Kevin J. Matherson, Reiner Creutzburg, David Akopian, Todor G. Georgiev, Andrew Lumsdaine, Cees G. M. Snoek, Lyndon S. Kennedy, editors, Multimedia Content and Mobile Devices 2013, Burlingame, California, USA, February 3-7, 2013. Volume 8667 of SPIE Proceedings, SPIE, 2013. [doi]

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Bo Jiang

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