Multi-resolution Abnormal Trace Detection Using Varied-length N-grams and Automata - researchr publication authors

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Guofei Jiang, Haifeng Chen, Cristian Ungureanu, Kenji Yoshihira. Multi-resolution Abnormal Trace Detection Using Varied-length N-grams and Automata. In Second International Conference on Autonomic Computing (ICAC 2005), 13-16 June 2005, Seattle, WA, USA. pages 111-122, IEEE Computer Society, 2005. [doi]

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