J. H. Jiang, Wen-Ben Jone, Shih-Chieh Chang, S. Ghosh. Embedded core test generation using broadcast test architecture and netlist scrambling. IEEE Transactions on Reliability, 52(4):435-443, 2003. [doi]
@article{JiangJCG03,
title = {Embedded core test generation using broadcast test architecture and netlist scrambling},
author = {J. H. Jiang and Wen-Ben Jone and Shih-Chieh Chang and S. Ghosh},
year = {2003},
doi = {10.1109/TR.2003.821931},
url = {http://dx.doi.org/10.1109/TR.2003.821931},
tags = {architecture, testing},
researchr = {https://researchr.org/publication/JiangJCG03},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {52},
number = {4},
pages = {435-443},
}