A New Coupled Metric Learning for Real-time Anomalies Detection with High-Frequency Field Programmable Gate Arrays

Frank Jiang, Dan Luo. A New Coupled Metric Learning for Real-time Anomalies Detection with High-Frequency Field Programmable Gate Arrays. In Zhi-Hua Zhou, Wei Wang, Ravi Kumar, Hannu Toivonen, Jian Pei, Joshua Zhexue Huang, Xindong Wu, editors, 2014 IEEE International Conference on Data Mining Workshops, ICDM Workshops 2014, Shenzhen, China, December 14, 2014. pages 1254-1261, IEEE, 2014. [doi]

@inproceedings{JiangL14a,
  title = {A New Coupled Metric Learning for Real-time Anomalies Detection with High-Frequency Field Programmable Gate Arrays},
  author = {Frank Jiang and Dan Luo},
  year = {2014},
  doi = {10.1109/ICDMW.2014.203},
  url = {http://dx.doi.org/10.1109/ICDMW.2014.203},
  researchr = {https://researchr.org/publication/JiangL14a},
  cites = {0},
  citedby = {0},
  pages = {1254-1261},
  booktitle = {2014 IEEE International Conference on Data Mining Workshops, ICDM Workshops 2014, Shenzhen, China, December 14, 2014},
  editor = {Zhi-Hua Zhou and Wei Wang and Ravi Kumar and Hannu Toivonen and Jian Pei and Joshua Zhexue Huang and Xindong Wu},
  publisher = {IEEE},
  isbn = {978-1-4799-4274-9},
}