Semiconductor Manufacturing Final Test Yield Optimization and Wafer Acceptance Test Parameter Inverse Design Using Multi-Objective Optimization Algorithms - researchr publication authors

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Dan Jiang, Weihua Lin, Nagarajan Raghavan. Semiconductor Manufacturing Final Test Yield Optimization and Wafer Acceptance Test Parameter Inverse Design Using Multi-Objective Optimization Algorithms. IEEE Access, 9:137655-137666, 2021. [doi]

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