He Jiang, Xiaochen Li, Zijiang Yang, Jifeng Xuan. What causes my test alarm?: automatic cause analysis for test alarms in system and integration testing. In Sebastián Uchitel, Alessandro Orso, Martin P. Robillard, editors, Proceedings of the 39th International Conference on Software Engineering, ICSE 2017, Buenos Aires, Argentina, May 20-28, 2017. pages 712-723, IEEE / ACM, 2017. [doi]
@inproceedings{JiangLYX17,
title = {What causes my test alarm?: automatic cause analysis for test alarms in system and integration testing},
author = {He Jiang and Xiaochen Li and Zijiang Yang and Jifeng Xuan},
year = {2017},
url = {http://dl.acm.org/citation.cfm?id=3097453},
researchr = {https://researchr.org/publication/JiangLYX17},
cites = {0},
citedby = {0},
pages = {712-723},
booktitle = {Proceedings of the 39th International Conference on Software Engineering, ICSE 2017, Buenos Aires, Argentina, May 20-28, 2017},
editor = {Sebastián Uchitel and Alessandro Orso and Martin P. Robillard},
publisher = {IEEE / ACM},
isbn = {978-1-5386-3868-2},
}