Tian Jiang, Lin Tan, Sunghun Kim. Personalized defect prediction. In 2013 28th IEEE/ACM International Conference on Automated Software Engineering, ASE 2013, Silicon Valley, CA, USA, November 11-15, 2013. pages 279-289, IEEE, 2013. [doi]
@inproceedings{JiangTK13-0,
title = {Personalized defect prediction},
author = {Tian Jiang and Lin Tan and Sunghun Kim},
year = {2013},
doi = {10.1109/ASE.2013.6693087},
url = {http://dx.doi.org/10.1109/ASE.2013.6693087},
researchr = {https://researchr.org/publication/JiangTK13-0},
cites = {0},
citedby = {0},
pages = {279-289},
booktitle = {2013 28th IEEE/ACM International Conference on Automated Software Engineering, ASE 2013, Silicon Valley, CA, USA, November 11-15, 2013},
publisher = {IEEE},
}