Good features to track: A view geometric approach

Jinwei Jiang, Alper Yilmaz. Good features to track: A view geometric approach. In IEEE International Conference on Computer Vision Workshops, ICCV 2011 Workshops, Barcelona, Spain, November 6-13, 2011. pages 72-79, IEEE, 2011. [doi]

Authors

Jinwei Jiang

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Alper Yilmaz

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