Qi Jiang, Huihui Yuan, Yang Wang, Xiangliang Jin. Design and analyze of transient-induced latch-up in RS485 transceiver with on-chip TVS. Microelectronics Reliability, 55(3-4):637-644, 2015. [doi]
@article{JiangYWJ15,
title = {Design and analyze of transient-induced latch-up in RS485 transceiver with on-chip TVS},
author = {Qi Jiang and Huihui Yuan and Yang Wang and Xiangliang Jin},
year = {2015},
doi = {10.1016/j.microrel.2014.12.012},
url = {http://dx.doi.org/10.1016/j.microrel.2014.12.012},
researchr = {https://researchr.org/publication/JiangYWJ15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {3-4},
pages = {637-644},
}