Data-Driven Batch-End Quality Modeling and Monitoring Based on Optimized Sparse Partial Least Squares

Qingchao Jiang, Xuefeng Yan, Hui Yi, Furong Gao. Data-Driven Batch-End Quality Modeling and Monitoring Based on Optimized Sparse Partial Least Squares. IEEE Transactions on Industrial Electronics, 67(5):4098-4107, 2020. [doi]

@article{JiangYYG20,
  title = {Data-Driven Batch-End Quality Modeling and Monitoring Based on Optimized Sparse Partial Least Squares},
  author = {Qingchao Jiang and Xuefeng Yan and Hui Yi and Furong Gao},
  year = {2020},
  doi = {10.1109/TIE.2019.2922941},
  url = {https://doi.org/10.1109/TIE.2019.2922941},
  researchr = {https://researchr.org/publication/JiangYYG20},
  cites = {0},
  citedby = {0},
  journal = {IEEE Transactions on Industrial Electronics},
  volume = {67},
  number = {5},
  pages = {4098-4107},
}