A model of VLSI interconnect test based on boundary scan - researchr publication authors

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Yang Jiangping, Li Guixiang, Wang Wanglei. A model of VLSI interconnect test based on boundary scan. In 8th International Conference on Control, Automation, Robotics and Vision, ICARCV 2004, Kunming, China, 6-9 December 2004, Proceedings. pages 557-561, IEEE, 2004. [doi]

This author has not been identified. Look up 'Yang Jiangping' in GoogleThis author has not been identified. Look up 'Li Guixiang' in GoogleThis author has not been identified. Look up 'Wang Wanglei' in Google

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