Yier Jin. CAD for Security: A Full Reverse Engineering Toolchain from Layout to RTL. In 2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020, Hsinchu, Taiwan, August 10-13, 2020. pages 1, IEEE, 2020. [doi]
@inproceedings{Jin20-10,
title = {CAD for Security: A Full Reverse Engineering Toolchain from Layout to RTL},
author = {Yier Jin},
year = {2020},
doi = {10.1109/VLSI-DAT49148.2020.9196373},
url = {https://doi.org/10.1109/VLSI-DAT49148.2020.9196373},
researchr = {https://researchr.org/publication/Jin20-10},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020, Hsinchu, Taiwan, August 10-13, 2020},
publisher = {IEEE},
isbn = {978-1-7281-6083-2},
}