P^(2)CLRAF: An Pre- and Post-Silicon Cooperated Circuit Lifetime Reliability Analysis Framework - researchr publication bibliographies

researchr

You are not signed in
Sign in
Sign up

Song Jin, Yinhe Han, Huawei Li, Xiaowei Li. P^(2)CLRAF: An Pre- and Post-Silicon Cooperated Circuit Lifetime Reliability Analysis Framework. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 117-120, IEEE Computer Society, 2010. [doi]

runs on WebDSL