Yier Jin, Nathan Kupp, Yiorgos Makris. DFTT: Design for Trojan Test. In 17th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2010, Athens, Greece, 12-15 December, 2010. pages 1168-1171, IEEE, 2010. [doi]
@inproceedings{JinKM10,
title = {DFTT: Design for Trojan Test},
author = {Yier Jin and Nathan Kupp and Yiorgos Makris},
year = {2010},
doi = {10.1109/ICECS.2010.5724725},
url = {http://dx.doi.org/10.1109/ICECS.2010.5724725},
researchr = {https://researchr.org/publication/JinKM10},
cites = {0},
citedby = {0},
pages = {1168-1171},
booktitle = {17th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2010, Athens, Greece, 12-15 December, 2010},
publisher = {IEEE},
isbn = {978-1-4244-8155-2},
}